XIAO, Yin; YAN, Gu. Research on Fault Diagnosis Technology of Electronic Products Based on Artificial Intelligence. International Journal of Advance in Applied Science Research, [S. l.], v. 5, n. 8, p. 54–59, 2026. Disponível em: https://h-tsp.com/index.php/ijaasr/article/view/346. Acesso em: 19 sep. 2026.